Single port single connection VNA calibration apparatus

ABSTRACT

A method and apparatus are used to calibration a Vector Network Analyzer (VNA). The method includes providing a calibration module with a single port, providing within the calibration module a set of reflecting components with known scattering parameters, providing control signals to the calibration module through the single port, providing the known scattering parameters to the VNA through the single port, coupling one of reflecting components to the VNA, measuring scattering parameters, and comparing the measured scattering parameters with the known scattering parameters. The apparatus includes a calibration module and a controller module. In one embodiment, the calibration module includes a set of reflecting components, a memory that stores the characterization data, and a current source which sends characterization data in the form of current pulses to the controller module. The controller module includes a voltage source that generates the control signals used by the calibration module.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to calibration of vector network analyzersin general and in particular to a single port, single connectioncalibration apparatus.

2. Description of the Related Art

Measurement errors in any vector network analyzer (VNA) contribute tothe uncertainty of the device being measured by the VNA. By quantifyingthese errors, their effects can be drastically reduced. Measurementerrors in network analysis can be separated into two categories: randomerrors and systematic errors. Random errors are non-repeatablemeasurement variations due to physical change (e.g., noise andtemperature changes) and, therefore, are usually unpredictable.Systematic errors are repeatable measurement variations in the testsetup itself (e.g., directivity, source match, frequency response, andleakage).

In most measurements made on “devices under test” (DUT) with a VNA, thesystematic errors are the most significant source of measurementuncertainty. Therefore, it is desirable to remove these errors from theVNA measurements. This is achieved through a VNA calibration.

The traditional calibration method requires an operator to press asequence of buttons on a VNA and manually connect and remove at leasethree “perfect” calibration components. The VNA measures each componentand transfers the accuracy of the standards to the VNA. This calibrationprocess is time-consuming and prone to operator error.

In contrast, an automatic calibration device is useful because itreduces calibration time and reduces the chance of operator error. Aprior art automatic calibration device for a one-port VNA is depicted inFIG. 1. The automatic calibration device 116 shown in FIG. 1 requires anoperator to connect the calibration device 116 to a test port 104 of theVNA 102 and press a button. The calibration device 116 thenautomatically calibrates the VNA by connecting the calibrationcomponents 120, 122, and 124 to test port 106 through switch 118. Thecalibration device 116 does not require “perfect” calibrationcomponents. Imperfect calibration components 120, 122 and 124 can beused as long as their characteristics (S-parameters) are repeatable andaccurately measured. These S-parameters are stored for use by the VNA102. During calibration, the VNA 102 measures the three calibrationcomponents 120, 122 and 124, and these measurement results and thepreviously stored S-parameter data are used to calculate correctionfactors. Calibration component 126 is used for verifying the accuracy ofthe VNA after it has been calibrated.

With the automatic calibration device depicted in FIG. 1, two types ofcommunication are performed between the calibration device 116 and theVNA 102. The first type of communication includes the transmission ofdigital control signals between the calibration device and thecontroller 128, while the second type of communication includes thetransmission and reception of microwave/radio (RF) signals between thecalibration device and the VNA. Thus, communication between thecalibration device 116 and the VNA 102 requires at least two ports onboth the calibration device and the VNA, along with two separate cables.A first cable 114 carries the digital control signals between a firstset of ports (108, 110), while a second cable 112 carries the RF signalsthrough a second set of ports (104, 106). In addition, the calibrationdevice 116 requires an external power supply.

Accordingly, it is an object of the present invention to provide amethod and apparatus for calibrating a VNA that requires only one cableand one set of ports for communication between an automatic calibrationdevice and the VNA. It is a further object of the present invention thatthe calibration device draw its power from the single cable.

SUMMARY OF THE INVENTION

In accordance with the present invention, an apparatus and method forcalibrating a VNA are provided. The method in accordance with thepresent invention includes the steps of providing a calibration modulewith a single port, providing within the calibration module a set ofreflecting components with known scattering parameters, providingcontrol signals to the calibration module through the single port,providing the known scattering parameters to the VNA through the singleport, coupling one of reflecting components to the VNA, measuringscattering parameters, comparing the measured scattering parameters withthe known scattering parameters, and determining calibration valueswhich can be utilized to correct errors introduced by the VNA. Thereflecting components include a short, an open and a low reflectionimpedance. The VNA transmits control signals to the calibration moduleby transmitting at least three voltage levels to the calibration module.The calibration module transmits the known scattering parameters to theVNA by transmitting current pulses to the VNA.

One implementation of an apparatus to calibrate a VNA using the methoddescribed includes a calibration module and a controller module. Thecalibration module includes a set of reflecting components and a switchfor connecting the reflecting components. The switch is controlled bycontrol signals received from the controller module. The calibrationmodule further includes a memory for storing the known scatteringparameters for the reflecting components and a microcontroller coupledto the memory. In alternate embodiments, the memory can also store thedate when the scattering parameters for the reflecting components werestored and the ambient temperature at which the scattering parameterswere stored. The microcontroller is controlled by the control signalsreceived from the controller module. Also included in the calibrationmodule is a current source coupled to the microcontroller, wherein thecurrent source provides current pulses to the controller module underdirection of the microcontroller. The controller module includes aprocessor, a voltage source coupled to the processor, wherein thevoltage source, under direction of the processor, generates the controlsignals used by the calibration module. The controller module furtherincludes a convertor coupled to the processor, wherein the convertorreceives the current pulses from the current source of the calibrationmodule, and wherein the convertor converts the current pulses intovoltage levels to be used by the processor.

BRIEF DESCRIPTION OF THE DRAWINGS

Details of the present invention will appear more clearly from thefollowing description in which the preferred embodiment of the inventionhas been set forth in conjunction with the drawings in which:

FIG. 1 is a block diagram depicting a prior art automatic VNAcalibration device;

FIG. 2 is a block diagram of a VNA calibration apparatus in accordancewith the present invention;

FIG. 3 is a block diagram of a calibration module in accordance with thepresent invention;

FIG. 4 is a block diagram of a controller module in accordance with thepresent invention;

FIG. 5 is a schematic diagram of a portion of a calibration module inaccordance with the present invention;

FIG. 6A is a schematic diagram of a portion of a calibration module inaccordance with the present invention;

FIG. 6B is a waveform diagram depicted in conjunction with FIG. 6A;

FIG. 7 is a schematic diagram of a portion of a controller module inaccordance with the present invention;

FIG. 8 is a schematic diagram of a portion of a controller module inaccordance with the present invention;

FIG. 9A is a schematic diagram of a portion of a controller module inaccordance with the present invention; and

FIG. 9B is a waveform diagram depicted in conjunction with FIG. 9A.

DETAILED DESCRIPTION

FIG. 2 depicts a general overview of a VNA calibration apparatus inaccordance with the present invention. As shown in FIG. 2, VNA 400 andcalibration module 300 communicate through a single RF line 202, whichcouples RF port 402 with RF port 302. RF line 202 carries controlsignals from VNA 400 to calibration module 300, and carries data fromcalibration module 300 to VNA 400. Controller module 410, which in oneembodiment is housed inside VNA 400, is connected to RF port 402. Switchassembly 304 couples the reflecting components 306, 308, 310, and 312 toRF port 302.

The manner of communication between VNA 400 and calibration module 300will now be discussed. Controller module 410transmits control signals tocalibration module 300 through RF line 202. These control signalscontrol the position of switch assembly 304 and the functions ofmicrocontroller 314. Controller module 410 controls the operation ofswitch assembly 304 by placing four distinct DC voltage levels on RFline 202. Each voltage level causes switch assembly 304 to connect oneof the reflecting components 306, 308, and 310, or verificationcomponent 312, to RF port 302. Controller module 410 controls thefunctions of microcontroller 314 by toggling between two DC voltagelevels on RF line 202. Calibration module 300 senses the edges of thepulses and converts the edges into logic level signals for use bymicrocontroller 314.

Calibration module 300 transmits stored characterization data(S-parameters) for the reflecting components to VNA 400 by varying thecurrent on RF line 202. VNA 400 senses the current on RF line 202 andconverts the current pulses into logic level signals for use by theVNA's microprocessor (not shown in FIG. 2). Additionally, calibrationmodule 300 is powered by DC voltage transmitted through RF line 202.

FIG. 3 is a block diagram depicting details of calibration module 300.RF port 302 of calibration module 300 is connected to RF port 402 ofVNA4 00. Calibration module 300 includes switch assembly 304 having atleast four positions for coupling reflecting components 306, 308, and310, and verifying component 312, to RF port 302. (The reflectingcomponents are referred to collectively with reference number 334.) Ingeneral, while more than three reflecting components could be used forcalibration, only three are necessary so long as their respectiveS-parameters are known and sufficiently distinct from each other.

Switch assembly 304 is controlled by voltage sense 318. Voltage sense318, along with the remaining components of calibration module 300,receive DC signals from RF port 302 through RF choke 316. RF choke 316isolates microwave/RF signals from voltage sense 318. Voltage sense 318senses the four voltage levels sent as control signals through RF port302 and causes switch assembly 304 to make the appropriate connectionsbased upon these voltage levels.

Power regulator 320 provides a constant 5V DC power source for variouscomponents of calibration module 300, including pulse edge detector 322,comparator 324, microcontroller 314, memory 326, and temperature sensor328. The DC power is drawn directly from the DC voltage on RF port 302.

Memory 326 stores characterization data for the reflecting components.This information is recalled and transmitted to VNA 400 under thedirection of microcontroller 314. Microcontroller 314, in turn, operatesunder the direction of control signals received from controller module410 through RF port 302. Controller module 410 transmits these controlsignals by toggling RF port 302 between two DC voltage levels. Pulseedge detector 322 senses the edges of the pulses, while comparator 324converts the edges into logic level signals for use by microcontroller314. In an alternate embodiment, the memory 326 can also store a datewhen the scattering parameters for the reflecting components were storedand the ambient temperature at which the scattering parameters werestored in memory 326. The storage date and temperature can be accessedto determine the when the module's reflecting components were lastcharacterized. In one embodiment, the module's reflecting components arere-characterized on an annual basis to mitigate the effects of aging.However, in alternate embodiments the module's reflecting components canbe re-characterized more or less frequently.

Calibration module 300 transmits the stored characterization data to VNA400 by varying the current on RF port 302. This varied current isgenerated by constant current source 332. The operation of constantcurrent source 332 is controlled by microcontroller 314. Calibrationmodule 300 optionally contains a temperature sensor 328. Becausecharacterization data can be affected by temperature, temperature sensor328 provides the ability to measure the temperature at the time thereflecting components are characterized. This temperature is stored inmemory 326 for future reference.

FIG. 4 is a block diagram depicting details of controller module 410.Controller module 410 is coupled to the VNA microprocessor 420 throughswitch assembly 418. When controller module 410 is not in use,microprocessor 420 is coupled to the VNA's serial port. Controllermodule 410 receives DC signals from RF port 402 through RF choke 404. RFchoke 404 ensures that RF signals do not enter into the controllermodule. DC relay 406 couples RF choke 404 to the remainder of controller410.

Voltage source 416, under the direction of microprocessor 420, providesthe DC voltage levels that operate as control signals for calibrationmodule 300. As explained above, controller module 410 controls switchassembly 304 by placing four distinct voltage levels on RF port 402, andcontrols microcontroller 314 by toggling between two voltage levels onRF port 402. Additionally, controller module 410 receivescharacterization data from calibration module 300 through RF port 402.As explained above, calibration module 300 transmits thecharacterization data by varying the current on RF port 402. Current tovoltage convertor 408 measures the current levels by measuring thevoltage across resistor 414, and converts these current levels intovoltage levels. Pulse shaper amplifier 411 and comparator 412 thenconvert these voltage levels into logic level signals that can be usedby VNA microprocessor 420.

Calibration Module

Further details of calibration module 300 will now be discussed. FIGS. 5and 6 together provide a schematic diagram of one embodiment ofcalibration module 300 in accordance with the present invention. FIG. 5depicts RF choke 316, switch assembly 304, voltage sense 318, andreflecting component 334. FIG. 6A depicts pulse edge detector 322,comparator 324, microcontroller 314, memory 326, temperature sensor 328and constant current source 332. FIGS. 5 and 6A are connected at points“1” and “2.” Each component depicted the accompanying figures is labeledwith an example component value. Resistor values are represented inohms, capacitor values in farads, and inductor values in henries,wherein “K” represents kilo-, “U” represents micro-, and “N” representsnano-. It should be noted that several components in the figures (e.g.,resistors and capacitors) can be combined into a single component ofequivalent value.

With reference to FIG. 5, voltage sense 318 senses the four DC voltagelevels sent as control signals through RF port 302 and causes switchassembly 304 to make the appropriate connections based upon thesevoltage levels. In one embodiment, a voltage level greater than −7.1Vconnects RF port 302 to an “open” component, a voltage between −7.1V and−11.6V connects RF port 302 to a “short,” and a voltage less than −11.6Vconnects RF port 302 to a “match.” Voltage sense 318 receives these DCvoltage levels through RF choke 3.6.

The operation of voltage sense 318, switch assembly 304 and reflectingcomponent 334 will now be discussed in the context of switching to an“open” component. Controller module 410 places a DC voltage levelgreater than −7.1V on RF port 302 (+9V in this example). This potentialon Node B turns off diodes CR3, CR4 and CR5, causing reflectingcomponent 334 to behave like an open circuit.

The operation of voltage sense 318, switch assembly 304 and reflectingcomponent 334 will now be discussed in the context of switching to a“short” component. Controller module 410 places a DC voltage levelbetween −7.1V and −11.6V on RF port 302 (−10V in this example). Avoltage of −10V on RF port 302 drives diodes CR2 and CR3, and the gatesof transistors Q2-Q7. With transistor Q2 turned on, the potential on thegate of transistor Q4 is lowered to ground, thus turning off transistorQ4. The potential on the gates of transistors Q5 and Q7 is also loweredto ground through Q3, turning off transistor Q5 and Q7. With transistorsQ4 and Q5 both turned off, a negative potential remains on the gate oftransistor Q6, turning on transistor Q6 and providing a DC connection toground for diode CR4. Together with the negative potential applied toNode B, such a configuration turns on diode CR4 and turns off diode CR5.With CR4 on, the capacitors C4 and C5 provide a low impedance path toground for RF signals at the test port. Hence, reflecting component 334behaves like an short circuit.

Lastly, the operation of voltage sense 318, switch assembly 304 andreflecting component 334 will now be discussed in the context ofswitching to a “match” (or “load”) component. Controller module 410places a DC voltage less than −11.6V on RF port 302 (−15V in thisexample). A voltage of −15V on RF port 302 drives diodes CR1, CR2 andCR3, and the gates of transistors Q1-Q7. With transistors Q1 and Q2turned on, the potential on the gates of transistors Q3 and Q4 islowered to ground, turning off transistors Q3 and Q4. Transistors Q5 andQ7 remain on because their gate potential remains negative. Withtransistor Q5 turned on, the gate potential of transistor Q6 is loweredto ground, turning off transistor Q6. Together with the negativepotential applied to Node B, such a configuration turns on diode CR5 andturns off diode CR4. With CR5 on, capacitors C6 and C7 and resistor R14provide a nearly resistive impedance to ground for RF signals at thetest port. Thus, reflecting component 334 behaves like a “match” or“load.”

FIG. 5 also comprises power regulator 320. Power regulator 320 receivesDC voltage from RF port 302 through RF choke 316, and provides aconstant 5V voltage source for various components of calibration module300, including pulse edge detector 322, comparator 324, microcontroller314, memory 326, and temperature sensor 328. Power regulator 320comprises component U1 which converts an input voltage into a 5V outputvoltage. In one embodiment, component U1 comprises Linear Technologypart no. LT1761ES5.

Attention is now drawn to FIG. 6A. As discussed above, microcontroller314 operates under the direction of control signals received fromcontroller module 410 through RF port 302. Controller module 410transmits these control signals by toggling RF port 302 between two DCvoltage levels. In one embodiment, RF port 302 is toggled between 9V and11V. Pulse edge detector 322 senses the edges of the pulses, whilecomparator 324 converts the edges into logic level signals (0V to 5V)for use by microcontroller 314.

The operation of pulse edge detector 322 and comparator 324 will now bediscussed. Controller module 410 toggles the voltage on RF port 302between 9V and 11V. The RF port's voltage waveform appears as a squarewave, as shown in FIG. 6B. Resistor R19 and capacitor C15 form adifferentiator. Current flows through R19 and C15 only during thetransitions between 9V and 11V. The current decays to zero after thetransition. Since Node C is nominally at 2.5V, which is set by the 5Vsource and resistors R20 and R21, the current flow through R19 and C15will perturb Node C's voltage when the input signal transitions between9V and 11V, as shown in FIG. 6B. Comparator 324 compares the voltage atNode C with the voltage at Node E. If the voltage on Node C is greaterthan the voltage on Node E, the output of comparator 324 changes to 0V.Thus, Node E's voltage sets the threshold voltage for the comparator tochange state.

Comparator 324 has two thresholds set by resistors R23, R24 and R25 andthe state of the comparator's output. When the comparator's output is5V, the voltage on Node E equals 2.9V, and when the comparator's outputis 0V, the voltage on Node E equals 2.1V. Having two thresholds reducesthe chance of the comparator switching states due to noise on the inputwaveform. This is a common technique called “hysteresis.” Diodes CR6 andCR7 act as limiters. They prevent Node C from rising above +5.3V orfalling below −0.3V.

The waveforms depicted in FIG. 6B will now be discussed in more detailin conjunction with FIG. 6A. Initially, the voltage on RF port 302 isconstant at 9V and Node C is at 2.5V. Assuming the output of comparator324 to be 5V, Node E is at 2.9V. (Upon powering up calibration module300, the output of comparator 324 maybe either 5V or 0V, but by applyingan initialization pulse sequence, the comparator's output can be set to5V before data transmission from the VNA 400 to calibration module 300).Next, the voltage on RF port 302 changes from 9V to 11V. This causescurrent to flow through R19 and C15 during the transition and perturbsNode C's voltage. Node C jumps from 2.5V to 3.3V and decays back to 2.5Vas the current flow through R19 and C15 diminishes to zero. Since NodeC's peak voltage (3.3V) is greater than Node E (2.9V), the comparator324's output will change from 5V to 0V. After the comparator's outputchanges to 0V, the voltage on Node E will then become 2.1V. This setsthe new threshold for comparator 324 to change its output state.

Next, the voltage on RF port 302 changes from 11V to 9V. Again, currentflows through R19 and C15 during the transition and perturbs Node C'svoltage. The direction of current flow causes Node C to jump from 2.5Vto 1.7V. As current flow through R19 and C15 diminishes, Node C recoversto 2.5V. Since Node C's minimum voltage (1.7V) is less than Node E(2.1V), the output of comparator 324 will change from 0V to 5V.

Memory 326 depicted in FIG. 6A stores characterization data for thereflecting components. In one embodiment, memory 326 comprises Atmelpart no. AT25256W-10SC-2.7. This characterization data is recalled andtransmitted to VNA 400 under the direction of microcontroller 314,which, in turn, operates under the direction of control signals receivedfrom controller module 410. In one embodiment, microcontroller 314comprises National Semiconductor part no. COP8SAA716M8P. The storedcharacterization data is transmitted to VNA 400 by varying the currenton RF port 302. This varied current is generated by constant currentsource 332, which includes switch (transistor) Q8. Transistor Q8 iscontrolled by microcontroller 314.

As shown in FIG. 6A, calibration module 300 contains a temperaturesensor 328. Because characterization data can be affected bytemperature, temperature sensor 328 provides the ability to measure thetemperature at the time the reflecting components are characterized.This temperature is stored in memory 326 for future reference. In oneembodiment, temperature sensor 328 comprises Analog Devices part no.AD7814ART.

Controller Module

Further details of controller 410 will now be discussed. FIGS. 7, 8 and9A together provide a schematic diagram of one embodiment of controllermodule 410 in accordance with the present invention. FIG. 7 depictsvoltage source 416, FIG. 8 depicts current to voltage convertor 408, andFIG. 9A depicts pulse shaper amplifier 411 and comparator 412. Thefigures are connected at points “1” and “2.”

With reference to FIG. 7, voltage source 416 consists of an op-amp U1that generates the four DC voltage levels sent as control signals tocalibration module 300. In one embodiment, the four voltage levels thatare generated are −10V, −15V, +9V and +11V. The desired voltage isselected by switching the right combination of resistors and voltages tothe op-amp inputs.

With reference to FIG. 8, current to voltage convertor 408 measures thecurrent drawn from calibration module 300 by measuring the voltageacross resistor R1 (resistor 414 of FIG. 4). Instrumentation amplifierU1 then amplifies this voltage drop. In one embodiment, amplifier U1comprises Texas Instruments part no. INA145UA. The output of current tovoltage convertor 408 is fed into pulse shaper amplifier 411 and broughtup to suitable DC values for input into comparator 412. Comparator 412converts these voltage levels into logic level signals that can be usedby VNA microprocessor 420.

Lastly, with reference to FIG. 9A and 9B, pulse shaper amplifier 411comprises two sections: the amplifier built around U1 and a servo(or“zeroing”) circuit built around U2. The calibration module 300modulates the current to send data to controller module 410. In oneembodiment, the current is toggled between 3 mA and 13 mA. Current tovoltage converter 408 converts the current to a voltage signal. As shownin FIG. 9B, the voltage signal received in this embodiment from currentto voltage converter 408 (at Node A) looks like a square wave withamplitude=511 mV and a DC offset=153 mV.

The signal on Node A is fed into amplifier U1, which has gain=(−R2/R1)=−2. Diodes CR2-CR4 limit the minimum output level=−0.9V and diode CR1limits the maximum level=+0.5V. Since the input signal has a DC offset,U1 amplifies it causing the output to also have a DC offset. One way toremove the DC offset is to use a servo circuit that forces the DC offsetat the output of U1 to be 0V. Q1 is a switch that connects U1's outputto the input U2. U2 acts as an integrator. U2's output is scaled down byR9 and R10 and connected to the positive input of U1. The circuitmonitors U1's output level and sends a correction voltage to U1'spositive input, causing the output of U1 to be 0V. The servo's inputneeds to be disconnected from U1's output after its output has been“zeroed.” Otherwise, U1 remains at 0V even when there is a square waveat Node A. Once disconnected, the servo circuit can still hold U1'soutput to 0V until node A's voltage changes. When receiving data fromthe calibration module 300, U1's output (after being zeroed) appears asa square wave toggling between 0V and −0.9V. Resistors R11 and R12 serveas a level shifter and shift U1's output to 1V and 1.8V. See FIG. 9B.This signal is then connected to the input of comparator 412. Comparator412 has threshold voltages of 1.25V and 1.45V. The thresholds are set byresistors R13, R14, R15, R16, and the state of the comparator's output.

The foregoing detailed description of the invention has been presentedfor purposes of illustration and description. It is not intended to beexhaustive or to limit the invention to the precise form disclosed, andobviously many modifications and variations are possible in light of theabove teaching. The described embodiments were chosen in order to bestexplain the principles of the invention and its practical application tothereby enable others skilled in the art to best utilize the inventionin various embodiments and with various modifications as are suited tothe particular use contemplated. It is intended that the scope of theinvention be defined by the claims appended hereto.

1. An apparatus for use in calibrating a Vector Network Analyzer (VNA)using only a single connection between the apparatus and the VNA that isbeing calibrated, the apparatus comprising: a single port through whichboth control signals and RE/microwave stimulus signals are received froma VNA that is being calibrated; a set of reflecting componentsswitchably connectable to the single port; a microcontroller operativelycoupled to the single port; wherein the microcontroller is controllableby the control signals received through the single port from a VNA thatis being calibrated; and wherein the microcontroller controls thetransmission of further signals through the single port to a VNA that isbeing calibrated.
 2. The apparatus of claim 1, further comprising amemory operatively coupled to the single port and the microcontroller,wherein the memory stores a set of known scattering parameters for theset of reflecting components.
 3. The apparatus of claim 2, furthercomprising a power regulator operatively coupled to the single port andthe microcontroller and the memory.
 4. The apparatus of claim 1, whereinthe set of reflection components comprises a short, an open and a lowreflection impedance.
 5. The apparatus of claim 1, wherein the furthersignals transmitted from the microcontroller to a VNA being calibratedinclude characterization data for the set of reflecting components. 6.An apparatus for use in calibrating a Vector Network Analyzer (VNA), theapparatus comprising: a port; a set of reflecting components switchablyconnectable to the port; a microcontroller operatively coupled to theport; a pulse edge detector operatively coupled to the port; and acomparator operatively coupled to the pulse edge detector and themicrocontroller; wherein the microcontroller is controllable by signalsreceived through the port from a VNA that is being calibrated; whereinthe microcontroller controls the transmission of signals through theport to a VNA that is being calibrated; wherein the pulse edge detectorsenses pulse edges of control signals received through the port from aVNA that is being calibrated; and wherein the comparator converts thepulse edges detected by the pulse edge detector to logic levels that cancontrol the microcontroller.
 7. The apparatus of claim 6, wherein thecontrol signals comprise at least two voltage levels.
 8. The apparatusof claim 6, further comprising a switch assembly coupled between theport and the set of reflecting components, the switch assembly adaptedto connect a selected one of the short, the open and the low reflectionimpedance to the port.
 9. The apparatus of claim 6, wherein theapparatus is adapted to be connected, to a VNA being calibrated, by asingle cable that is connected between the port of the apparatus and asingle port of the VNA being calibrated, without any further cablesbeing connected between the apparatus and the VNA being calibrated. 10.An apparatus for use in calibrating a Vector Network Analyzer (VNA), theapparatus comprising: a port; a set of reflecting components switchablyconnectable to the port; a microcontroller operatively coupled to theport; wherein the microcontroller is controllable by signals receivedthrough the port from a VNA that is being calibrated; wherein themicrocontroller controls the transmission of signals through the port toa VNA that is being calibrated; and wherein the set of reflectioncomponents comprises a short, an open and a low reflection impedance.11. The apparatus of claim 10, further comprising a switch assemblycoupled between the port and the set of reflecting components, theswitch assembly adapted to connect a selected one of the short, the openand the low reflection impedance to the port.
 12. The apparatus of claim10, wherein the apparatus is adapted to be connected, to a VNA beingcalibrated, by a single cable that is connected between the port of theapparatus and a single port of the VNA being calibrated, without anyfurther cables being connected between the apparatus and the VNA beingcalibrated.
 13. The apparatus of claim 10, further comprising a switchassembly coupled between the port and the set of reflecting components,the switch assembly adapted to connect a selected one of the short, theopen and the low reflection impedance to the port.
 14. The apparatus ofclaim 10, wherein the apparatus is adapted to be connected, to a VNAbeing calibrated, by a single cable that is connected between the portof the apparatus and a single port of the VNA being calibrated, withoutany further cables being connected between the apparatus and the VNAbeing calibrated.
 15. An apparatus for use in calibrating a VectorNetwork Analyzer (VNA) using only a single connection between theapparatus and the VNA that is being calibrated, the apparatuscomprising: a single port through which both control signals andRE/microwave stimulus signals are transmitted; a set of reflectingcomponents providing a set of known scattering parameters; a switchhaving a first end operatively coupled to the single port and a secondend selectively connectable to individual ones of the set of reflectioncomponents, wherein the switch is controlled by a first set of thecontrol signals received through the single port; and a microcontrolleroperatively coupled to the single port, wherein the microcontroller iscontrolled by a second set of the control signals received through thesingle port.
 16. The apparatus of claim 15, further comprising a memoryoperatively coupled to the single port and the microcontroller, whereinthe memory stores the set of known scattering parameters.
 17. Theapparatus of claim 16, further comprising a power regulator operativelycoupled to the single port and the microcontroller and the memory. 18.The apparatus of claim 15, wherein the first set of control signalscomprises at least three voltage levels.
 19. The apparatus of claim 15,wherein the second set of control signals comprises at least two voltagelevels.
 20. The apparatus of claim 15, further comprising a currentsource operatively coupled to the microcontroller and the single port,wherein the current source provides current pulses through the portunder direction of the microcontroller.
 21. The apparatus of claim 15,further comprising: a memory operatively coupled to the single port andthe microcontroller, wherein the memory stores the set of knownscattering parameters; and a power regulator operatively coupled to thesingle port and the microcontroller and the memory.
 22. The apparatus ofclaim 15, further comprising: a voltage sensor operatively coupled tothe single port and the switch, wherein the voltage sensor is configuredfor receiving the first set of control signals and for controlling theoperation of the switch.
 23. An apparatus for use in calibrating aVector Network Analyzer (VNA), the apparatus comprising: a single port;a set of reflecting components providing a set of known scatteringparameters; a switch having a first end operatively coupled to thesingle port and a second end selectively connectable to individual onesof the set of reflection components, wherein the switch is controlled bya first set of control signals received through the single port; amicrocontroller operatively coupled to the single port, wherein themicrocontroller is controlled by a second set of control signalsreceived through the single port; and a voltage sensor operativelycoupled to the single port and the switch, wherein the voltage sensor isconfigured for receiving the first set of control signals through thesingle port and for controlling the operation of the switch.
 24. Anapparatus for use in calibrating a Vector Network Analyzer (VNA), theapparatus comprising: a port; a set of reflecting components providing aset of known scattering parameters; a switch having a first endoperatively coupled to the port and a second end selectively connectableto individual ones of the set of reflection components, wherein theswitch is controlled by a fist set of control signals received throughthe port; and a microcontroller operatively coupled to the port, whereinthe microcontroller is controlled by a second set of control signalsreceived through the port; wherein the set of reflection componentscomprises a short, an open and a low reflection impedance.
 25. A methodfor providing to a Vector Network Analyzer (VNA) a set of knownscattering parameters for a set of reflecting components, the methodcomprising the steps of: providing a calibration apparatus for use incalibrating a VNA using only asingle connection between the apparatusand the VNA, the calibration apparatus including a single port;providing, within the calibration apparatus, a memory for storing theset of known scattering parameters; providing, within the calibrationapparatus, a microcontroller operatively coupled to the single port andto the memory; providing, within the calibration apparatus, a currentsource operatively coupled to the single port and to themicrocontroller; and providing a the VNA with the set of knownscattering parameters by transmitting current pulses that are indicativeof the set of known scattering parameters, from the current sourcethrough the single port to the VNA under direction of themicrocontroller.
 26. An apparatus for use in calibrating a VectorNetwork Analyzer (VNA), the apparatus comprising: a port; a set ofreflecting components providing a set of known scattering parameters; aswitch having a first end operatively coupled to the port and a secondend selectively connectable to individual ones of the set of reflectioncomponents, wherein the switch is controlled by a first set of controlsignals received through the port; a microcontroller operatively coupledto the port, wherein the microcontroller is controlled by a second setof control signals received through the port; a memory operativelycoupled to the port and the microcontroller, wherein the memory storesthe set of known scattering parameters; and a power regulatoroperatively coupled to the port and the microcontroller and the memory;wherein the power regulator uses signals received through the port, froma VNA being calibrated, to produce a voltage that powers themicrocontroller and the memory.
 27. An apparatus for use in calibratinga Vector Network Analyzer (VNA) using only a single connection betweenthe apparatus and the VNA that is being calibrated, the apparatuscomprising: a single port; a set of reflecting components switchablyconnectable to the single port; a microcontroller operatively coupled tothe single port; a pulse edge detector operatively coupled to the singleport; and a comparator operatively coupled to the pulse edge detectorand the microcontroller; wherein the microcontroller is controllable bysignals received through the single port from a VNA that is beingcalibrated; wherein the microcontroller controls the transmission ofsignals through the single port to a VNA that is being calibrated;wherein the pulse edge detector senses pulse edges of control signalsreceived through the single port from a VNA that is being calibrated;and wherein the comparator converts the pulse edges detected by thepulse edge detector to logic levels that can control themicrocontroller.
 28. The apparatus of claim 27, wherein the controlsignals comprise at least two voltage levels.
 29. An apparatus for usein calibrating a Vector Network Analyzer (VNA) using only a singleconnection between the apparatus and the VNA that is being calibrated,the apparatus comprising: a single port; a set of reflecting componentsproviding a set of known scattering parameters; a switch having a firstend operatively coupled to the single port and a second end selectivelyconnectable to individual ones of the set of reflection components,wherein the switch is controlled by a first set of control signalsreceived through the single port; a microcontroller operatively coupledto the single port, wherein the microcontroller is controlled by asecond set of control signals received through the single port; a memoryoperatively coupled to the single port and the microcontroller, whereinthe memory stores the set of known scattering parameters; and a powerregulator operatively coupled to the single port and the microcontrollerand the memory; wherein the power regulator uses signals receivedthrough the single port, from a VNA being calibrated, to produce avoltage that powers the microcontroller and the memory.
 30. An apparatusfor use in calibrating a Vector Network Analyzer (VNA) using only asingle connection between the apparatus and the VNA that is beingcalibrated, the apparatus comprising: a single port through which bothcontrol signals and RF/microwave stimulus signals are received from aVNA that is being calibrated; and a set of reflecting componentsswitchably connectable to the single port; wherein controls signalsreceived through the single port control which one of the reflectingcomponents is connected to the single port; and wherein RE/microwavestimulus signals received through the single port are incident upon thereflecting component connected to the single port at the time thestimulus signals are received.